LAI Xiu-juan~a,MA Li~b,HAN Dao-fu~b,QI Xiao-ping~b(a.College of Mechanical and Electrical Engineering;b.College of Science,Nanchang University,Nanchang 330031,China)
Abstract：Movement of a surface profile is measured with a two-grating interferometer using sinusoidal phase-modulation.Interference patterns which are caused by the movement of an object are captured.By computed the phase,the surface profile of an object is recove
2009, Vol. 33 