WEI Shenga,LIU Nan-shenga,LIU Ming-youb,GUO Chang-rongb(a.College of Science;b.College of Mechanical and Electronic Engineering,Nanchang University,Nanchang 330031,China)
Abstract：Fundamental of Fourier Transform Profilometry is adopted,the essential technology to extract base frequency information line by line is adopted through fourier transform of the stripe image,which can enhancement measuring accuracy and phase value of the o
2007, Vol. 31 